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Recent Advances of the Open Source MULTEM Program to Provide Accurate and Fast Electron Microscopy Simulations

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927617001714
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Abstract

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Categories
Instrumentation
Date

July 1, 2017

Authors
I.P. Lobato HoyosJ. VerbeeckS. Van Aert
Publisher

Cambridge University Press (CUP)


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