Learning From Scanning Transmission Electron Microscopy to Enhance Transmission X-Ray Microscopy: How We Can Merge STEM and TXM Datasets?

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927616002051
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

X-Ray Nanospectroscopic Research With Scanning Transmission X-Ray Microscopy

Journal of the Vacuum Society of Japan
SurfacesInstrumentationInterfacesSpectroscopyMaterials Science
2016English

Manifold Learning of Four-Dimensional Scanning Transmission Electron Microscopy

npj Computational Materials
Mechanics of MaterialsMaterials ScienceSimulationComputer Science ApplicationsModeling
2019English

Scanning Transmission X-Ray Microscopy of Isolated Multiwall Carbon Nanotubes

Applied Physics Letters
AstronomyPhysics
2006English

Defect Characterization Using Transmission Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2018English

Characterizing Automotive Fuel Cell Materials by Soft X-Ray Scanning Transmission X-Ray Microscopy

2016English

Soft X-Ray Microscopy With a Cryo Scanning Transmission X-Ray Microscope: II. Tomography

Journal of Microscopy
Forensic MedicinePathologyHistology
2000English

Applications of Scanning Transmission X-Ray Microscopy (STXM) to Industrially Relevant Polymeric Materials

Microscopy and Microanalysis
Instrumentation
2003English

Transmission Electron Microscopy

Springer Series in Optical Sciences
OpticalElectronicMagnetic Materials
2008English

Crystal Structure Analysis Using Scanning Transmission Electron Microscopy

Nihon Kessho Gakkaishi
2019English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy