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Degradation Studies on High-Voltage-Driven Organic Light-Emitting Device Using in Situ On-Operation Method With Scanning Photoelectron Microscopy
Applied Physics Letters
- United States
doi 10.1063/1.2994668
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Categories
Astronomy
Physics
Date
September 29, 2008
Authors
J. Lee
S. Sohn
H. J. Yun
H. J. Shin
Publisher
AIP Publishing
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