Cross-Section of Asbestos Prepared for TEM/STEM With Ion Slicer

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927610054243
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Observation of Cross Sectional Semiconductor Sample With Newly Developed SEI/STEM/TEM Microscope

Microscopy and Microanalysis
Instrumentation
2003English

Atomic Negative-Ion-Photodetachment Cross-Section and Affinity Measurements

Journal of Research of the National Bureau of Standards
1955English

Repeatability of Automated FIB Prepared TEM Samples With Low keV Cleaning

Microscopy and Microanalysis
Instrumentation
2010English

Optimization of Ion Millers for TEM Sample Preparation

Microscopy Today
1995English

Benefits and Possibilities of Cc–Correction for TEM / STEM

Microscopy and Microanalysis
Instrumentation
2002English

Nanomilling for Aberration – Corrected TEM and HAADF STEM

Microscopy and Microanalysis
Instrumentation
2009English

Algorithm for Radar Cross Section Estimation

IOSR Journal of Engineering
2014English

Hydraulic Calculation of Channels With Composed Cross Section

Environmental Engineering and Management Journal
ManagementMonitoringPolicyLawEnvironmental EngineeringPollution
2013English

Variation of Photoneutron Cross Section With Mass Number

Acta Physica Polonica A
AstronomyPhysics
2015English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy