Amanote Research
Register
Sign In
Fault-Driven Testing of LSI Analog Circuits
doi 10.1109/mwscas.1992.271146
Full Text
Open PDF
Abstract
Available in
full text
Date
Unknown
Authors
C.-Y. Chao
H.-J. Lin
L. Milor
Publisher
IEEE
Related search
Evaluation of Signature-Based Testing of RF/Analog Circuits
Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage
Journal of Applied Mathematics
Applied Mathematics
Fault Diagnosis in Analog Integrated Circuits Using Artificial Neural Networks
International Journal of Computer Applications
LSI Product Quality and Fault Coverage
A Methodology to Perform Online Self-Testing for Field-Programmable Analog Array Circuits
IEEE Transactions on Instrumentation and Measurement
Electronic Engineering
Electrical
Instrumentation
Brain-Like Vision Systems Using Merged Analog-Digital LSI Architecture
IEICE ESS FUNDAMENTALS REVIEW
A Single-Chip NMOS Analog Front-End LSI for Modems
IEEE Journal of Solid-State Circuits
Electronic Engineering
Electrical
Digitally Assisted Analog and RF Circuits
IEICE Transactions on Electronics
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Analog Integrated Circuits and Signal Processing
Analog Integrated Circuits and Signal Processing
Surfaces
Signal Processing
Hardware
Architecture
Films
Coatings
