Roughness Analysis in Strained Silicon-On-Insulator Wires and Films

Journal of Applied Physics - United States
doi 10.1063/1.4896301
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Strained Silicon-On-Insulator - Fabrication and Characterization

2007English

Fabrication of Ultra-Thin Strained Silicon on Insulator

Journal of Electronic Materials
Electronic EngineeringCondensed Matter PhysicsOpticalMaterials ChemistryElectricalMagnetic MaterialsElectronic
2003English

Role of Surface-Roughness Scattering in Double Gate Silicon-On-Insulator Inversion Layers

Journal of Applied Physics
AstronomyPhysics
2001English

Surface Roughness at the Si–SiO2 Interfaces in Fully Depleted Silicon-On-Insulator Inversion Layers

Journal of Applied Physics
AstronomyPhysics
1999English

Interfacial Phonon Scattering and Transmission Loss in >1 Μm Thick Silicon-On-Insulator Thin Films

Physical Review B
OpticalElectronicCondensed Matter PhysicsMagnetic Materials
2018English

Experimental Verification of Temperature Calculations in Multilayers Used for CO2laser Recrystallization of Silicon‐on‐insulator Films

Journal of Applied Physics
AstronomyPhysics
1990English

Anomalous Thermoelectricity in Strained Bi2Te3 Films

Scientific Reports
Multidisciplinary
2016English

Imaging by Silicon on Insulator Waveguides

Applied Physics Letters
AstronomyPhysics
2009English

Lateral Interband Tunneling Transistor in Silicon-On-Insulator

Applied Physics Letters
AstronomyPhysics
2004English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy