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Exploratory Dielectric Study Involving Ultra-Low Content of Si-C-Al in Epoxy
doi 10.1109/ceidp.2014.6995858
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Date
October 1, 2014
Authors
M. F. Frechette
I. Preda
H. Alamdari
P. Lewin
A. Holt
T. Heid
Publisher
IEEE
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