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X-Ray Photoelectron Spectroscopy, X-Ray Absorption Spectroscopy, and X-Ray Diffraction Characterization of CuO–TiO2–CeO2 Catalyst System

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films - United States
doi 10.1116/1.1345911
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Abstract

Available in full text

Categories
SurfacesFilmsInterfacesCondensed Matter PhysicsCoatings
Date

July 1, 2001

Authors
M. S. P. FranciscoP. A. P. NascenteV. R. MastelaroA. O. Florentino
Publisher

American Vacuum Society


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