Wide-Area Scanner for High-Speed Atomic Force Microscopy

Review of Scientific Instruments - United States
doi 10.1063/1.4803449
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy