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Diffraction Data Quality Analysis ofEVAL15integration

Acta Crystallographica Section A Foundations of Crystallography
doi 10.1107/s0108767311096188
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Abstract

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Date

August 22, 2011

Authors
L. M. J. Kroon-BatenburgP. ParoisA. M. M. SchreursM. Lutz
Publisher

International Union of Crystallography (IUCr)


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