Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis

VLSI Design - United States
doi 10.1155/2001/28741
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Hindawi Limited

Related search

On Defect Level Estimation and the Clustering Effect

IFIP Advances in Information and Communication Technology
Computer NetworksInformation SystemsManagementCommunications
2000English

Testing for Stochastic Monotonicity

2008English

Using Perturbation Analysis for Gradient Estimation, Averaging and Updating in a Stochastic Approximation Algorithm

English

A Security Analysis of Key Expansion Functions Using Pseudorandom Permutations

Lecture Notes in Computer Science
Computer ScienceTheoretical Computer Science
2014English

Online Noise Estimation Using Stochastic-Gain HMM for Speech Enhancement

IEEE Transactions on Audio, Speech, and Language Processing
2008English

On Testing for Stochastic Dissociations

Psychonomic Bulletin and Review
DevelopmentalArtsEducational PsychologyCognitive PsychologyHumanitiesExperimental
1996English

Parameter Estimation Using Simultaneous Perturbation Stochastic Approximation

IEEJ Transactions on Electronics, Information and Systems
Electronic EngineeringElectrical
2004English

Testing for Restricted Stochastic Dominance

SSRN Electronic Journal
2006English

Stochastic Metamodel for Probability of Detection Estimation of Eddy-Current Testing Problem in Random Geometric

IEEE Transactions on Magnetics
Electronic EngineeringOpticalElectricalMagnetic MaterialsElectronic
2019English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy