MEMS Stage and Piezoelectric Motor-Controlled TEM Holder for Quantitative In-Situ Testing of Thin Film Specimens
Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927602104806
Full Text
Open PDFAbstract
Available in full text
Categories
Date
August 1, 2002
Authors
Publisher
Cambridge University Press (CUP)