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Current and Future Aberration Correctors for the Improvement of Resolution in Electron Microscopy
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
- United Kingdom
doi 10.1098/rsta.2009.0121
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Categories
Mathematics
Engineering
Astronomy
Physics
Date
September 28, 2009
Authors
M. Haider
P. Hartel
H. Müller
S. Uhlemann
J. Zach
Publisher
The Royal Society