Electron Skirts and X-Ray Correction: Evaluating Methods for Rapid Discrimination of Primary Versus Secondary X-Ray Signals in the ESEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927605506822
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Method for Reducing X-Ray Background Signals From Insertion Device X-Ray Beam Position Monitors

Physical Review Special Topics - Accelerators and Beams
1999English

Digital Rise-Time Discrimination of Large-Area Avalanche Photodiode Signals in X-Ray Detection

IEEE Transactions on Nuclear Science
Electronic EngineeringNuclearNuclear EnergyHigh Energy PhysicsEngineeringElectrical
2002English

Application of the Tikhonov Unfolding Method for Reconstruction of Primary X-Ray Spectra From X-Ray Equipments

Progress in Nuclear Science and Technology
2011English

Modulator Design for X-Ray Scatter Correction Using Primary Modulation: Material Selection

Medical Physics
MedicineNuclear MedicineRadiologyImagingBiophysics
2010English

Novel Applications of Rapid Prototyping in Gamma-Ray and X-Ray Imaging

2009English

Correction of X-Ray Intensities for Multiple Diffraction

Acta Crystallographica Section A Foundations of Crystallography
1987English

Attosecond X-Ray Free Electron Laser

EPJ Web of Conferences
AstronomyPhysics
2013English

Carbon Nanotube Electron Emitter for X-Ray Imaging

Materials
Materials ScienceCondensed Matter Physics
2012English

X-Ray Energy Spectrometry for Electron-Probe Analysis.

The Journal of the Geological Society of Japan
1984English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy