Infrared Spectroscopic Study of Atomic Layer Deposition Mechanism for Hafnium Silicate Thin Films Using HfCl2[N(SiMe3)2]2 and H2O
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films - United States
doi 10.1116/1.1806442
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Date
November 1, 2004
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American Vacuum Society