An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy Using Delauney Triangulation

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927619001508
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Deep Learning for Sparse Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2019English

Scanning Electron Microscopy

2013English

Scanning Electron Microscopy

2012English

Scanning Electron Microscopy

2019English

Defect Characterization Using Transmission Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2018English

Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures

Microscopy and Microanalysis
Instrumentation
2019English

Scanning Electron Microscopy

2003English

Crystal Structure Analysis Using Scanning Transmission Electron Microscopy

Nihon Kessho Gakkaishi
2019English

Using Confocal Laser Scanning Microscopy, Scanning Electron Microscopy and Phase Contrast Light Microscopy to Examine Marine Biofilms

Aquatic Microbial Ecology
EvolutionEcologySystematicsAquatic ScienceBehavior
1998English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy