Development of a Synchrotron Biaxial Tensile Device for in Situ Characterization of Thin Films Mechanical Response

Review of Scientific Instruments - United States
doi 10.1063/1.3488628
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Development of Biaxial Tensile Test System for In-Situ Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
AlloysCondensed Matter PhysicsMetalsTheoretical ChemistryMaterials ChemistryPhysical
2019English

Mechanical Behavior of Thin Films Due to In-Plane Tensile and Fatigue Loadings

AIP Advances
NanotechnologyAstronomyPhysicsNanoscience
2019English

Local Mechanical Response in Biological Thin Films and Nanostructures

Biophysical Journal
Biophysics
2013English

Molecular Beam Epitaxy Preparation and in Situ Characterization of FeTe Thin Films

Physical Review Materials
Materials ScienceAstronomyPhysics
2020English

Mechanical Characterization of Solution-Derived Nanoparticle Silver Ink Thin Films

Journal of Applied Physics
AstronomyPhysics
2007English

Nanoprobe Mechanical and Piezoelectric Characterization of ScxAl1−xN(0001) Thin Films

Physica Status Solidi (A) Applications and Materials Science
SurfacesElectronic EngineeringCondensed Matter PhysicsMaterials ChemistryOpticalElectricalMagnetic MaterialsFilmsCoatingsElectronicInterfaces
2014English

In-Situ Characterization of Mechanical and Electrical Response of Individual BCN Nanotubes

Microscopy and Microanalysis
Instrumentation
2011English

Biaxial Tensile Tester for Flat Plates

Zairyo/Journal of the Society of Materials Science, Japan
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
1968English

In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes

English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy