Charging Damage During Residual Metal Overetching

Applied Physics Letters - United States
doi 10.1063/1.123413
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

The Influence of Mask Thickness on Charging Damage During Overetching

Journal of Applied Physics
AstronomyPhysics
1997English

Wafer Charging in Process Equipment and Its Relationship to GMR Heads Charging Damage

English

Trapped Photoelectrons During Spacecraft Charging in Sunlight

IEEE Transactions on Plasma Science
High Energy PhysicsNuclearCondensed Matter Physics
2015English

GaAs METAL ORGANICS VAPOUR PHASE EPITAXY : RESIDUAL CARBON

Le Journal de Physique Colloques
1982English

Charging and Exciton-Mediated Decharging of Metal Nanoparticles in Organic Semiconductor Matrices

Applied Physics Letters
AstronomyPhysics
2014English

Charging of a Structured Material During Electron Beam Exposure

Microscopy and Microanalysis
Instrumentation
2002English

Damage Identification of Laminated Plates Based on Dynamic Residual Forces.

Journal of the Japan Society for Composite Materials
2000English

Surface Charging Effects During Photoanodic Dissolution of N-GaAs Electrodes

Journal of the Electrochemical Society
SurfacesCondensed Matter PhysicsOpticalElectrochemistrySustainabilityMaterials ChemistryMagnetic MaterialsRenewable EnergyFilmsCoatingsElectronicthe Environment
1983English

Development of Residual Stresses During Laser Cladding

2018English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy