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An Application of 200 KV to Engineering Materials
Ultramicroscopy
- Netherlands
doi 10.1016/0304-3991(82)90118-8
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Categories
Instrumentation
Optics
Molecular Physics,
Optical
Atomic
Magnetic Materials
Electronic
Date
January 1, 1982
Authors
J. Beyer
Publisher
Elsevier BV
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