Comment on “In Situ X-Ray Photoelectron Spectroscopic and Density-Functional Studies of Si Atoms Adsorbed on a C60 Film” [J. Chem. Phys. 121, 11351 (2004)]
Journal of Chemical Physics - United States
doi 10.1063/1.1929735
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Date
June 15, 2005
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AIP Publishing