(PDF) Hot Electron Degradation of the DC and RF

Hot Electron Degradation of the DC and RF Characteristics of AlGaAs/InGaAs/GaAs PHEMT's

IEEE Transactions on Electron Devices - United States

doi 10.1109/16.658668

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Abstract

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Categories

Electronic Engineering

Magnetic Materials

Date

January 1, 1998

Authors

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

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