Induced Charge Fluctuations in Semiconductor Detectors With a Cylindrical Geometry

EPJ Web of Conferences - France
doi 10.1051/epjconf/201817001014
Full Text
Abstract

Available in full text

Date
Authors
Publisher

EDP Sciences

Related search

Induced Charge Fluctuations in Hemispherical Semiconductor Detectors

X-Ray Spectrometry
Spectroscopy
2017English

Effective Cadmium Cutoff Energies for Cylindrical Detectors With Cylindrical Filters

Journal of Nuclear Science and Technology
High Energy PhysicsNuclearEngineeringNuclear Energy
1964English

Damage Experiments in a Cylindrical Geometry

EPJ Web of Conferences
AstronomyPhysics
2010English

Semiconductor Cavity QED: Band Gap Induced by Vacuum Fluctuations

Physical Review A
2014English

Charge Collection in Silicon Strip Detectors With a Large Strip Pitch

English

Radiation Damage of Semiconductor Detectors

RADIOISOTOPES
1973English

A FET Preamplifier for Cooled Semiconductor Detectors

Journal of the Atomic Energy Society of Japan / Atomic Energy Society of Japan
1966English

Charge Fluctuations in Geometrically Frustrated Charge Ordering System

Journal of the Physical Society of Japan
AstronomyPhysics
2006English

Harnessing Nuclear Spin Polarization Fluctuations in a Semiconductor Nanowire

Nature Physics
AstronomyPhysics
2013English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy