Combined Atomic Force Microscope and Electron-Beam Lithography Used for the Fabrication of Variable-Coupling Quantum Dots

Applied Physics Letters - United States
doi 10.1063/1.1599972
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Centimeter Scale Atomic Force Microscope Imaging and Lithography

Applied Physics Letters
AstronomyPhysics
1998English

Electron Beam Lithography Fabrication of SU-8 Polymer Structures for Cell Studies

2019English

Athermalization in Atomic Force Microscope Based Force Spectroscopy Using Matched Microstructure Coupling

Review of Scientific Instruments
MedicineInstrumentation
2009English

Atomic Beam Manipulation and Atom Lithography

The Review of Laser Engineering
2004English

Nanodevice Fabrication Technologies With Advanced High Resolution Electron Beam Lithography Systems

Nanoindustry Russia
2015English

Electron Beam Lithography Using GaAs Oxidized Resist for GaAs/AlGaAs Ultrafine Structure Fabrication.

Journal of Photopolymer Science and Technology
Organic ChemistryPolymersMaterials ChemistryPlastics
1994English

Electron-Vibron Coupling in Suspended Carbon Nanotube Quantum Dots

Physical Review B
2009English

Electron Beam Lithography System.

Journal of the Japan Society of Precision Engineering
1985English

Fabrication of a Three-Dimensional Plasmon Ruler Using an Atomic Force Microscope

English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy