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Image Quality Assessment of a CMOS/Gd2O2S:Pr,Ce,F X-Ray Sensor

Journal of Sensors - Egypt
doi 10.1155/2015/874637
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Abstract

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Categories
ControlSystems EngineeringInstrumentationElectricalElectronic Engineering
Date

January 1, 2015

Authors
Christos Michail
Publisher

Hindawi Limited


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