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Soft X-Ray (50-1800 eV) Measurements of Niobium Superconducting Tunnel Junctions
doi 10.1117/12.218382
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Date
September 1, 1995
Authors
David H. Lumb
Axel van Dordrecht
Anthony J. Peacock
Nicola Rando
Peter Verhoeve
J. Verveer
D. J. Goldie
John M. Lumley
Publisher
SPIE