Studies of Single Dopant Atoms on Nanocrystalline Γ-Alumina Supports by Aberration-Corrected Z-Contrast STEM and First Principles Calculations

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927603441998
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Depth Sectioning of Individual Dopant Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy

Applied Physics Letters
AstronomyPhysics
2008English

Aberration-Corrected HAADF-STEM Studies of Nano-Gold/Titania Catalysts

Microscopy and Microanalysis
Instrumentation
2010English

Efficient Elastic Imaging of Single Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2011English

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Microscopy and Microanalysis
Instrumentation
2014English

EDX Analysis of Low Concentration Dopant Using HD-2700 Aberration Corrected STEM Equipped With Dual SDD

Microscopy and Microanalysis
Instrumentation
2015English

Ultra-High Vacuum Aberration-Corrected STEM for In-Situ Studies

Microscopy and Microanalysis
Instrumentation
2016English

Aberration-Corrected STEM for Elemental Mapping

Microscopy and Microanalysis
Instrumentation
2003English

Nanomilling for Aberration – Corrected TEM and HAADF STEM

Microscopy and Microanalysis
Instrumentation
2009English

High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM

Microscopy and Microanalysis
Instrumentation
2017English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy