Spectroscopic Microscopy Can Quantify the Statistics of Subdiffractional Refractive-Index Fluctuations in Media With Random Rough Surfaces

Optics Letters - United States
doi 10.1364/ol.40.004931
Full Text
Abstract

Available in full text

Date
Authors
Publisher

The Optical Society

Related search

Wave Propagation and Scattering in Random Media and Rough Surfaces

Proceedings of the IEEE
Electronic EngineeringElectricalComputer Science
1991English

Statistics of Random Surfaces

Journal of Research of the National Bureau of Standards, Section D: Radio Science
1964English

Diffraction From Anisotropic Random Rough Surfaces

Physical Review B
1998English

Generating Random Rough Edges, Surfaces, and Volumes

Applied Optics
Electronic EngineeringMolecular Physics,EngineeringElectricalAtomicOptics
2013English

Concentration Statistics for Transport in Random Media

Physical Review E
2009English

Estimation of Kinetic Properties of Particles Forming Random Rough Surfaces

Solid State Communications
Materials ChemistryChemistryCondensed Matter Physics
1997English

Measuring Adhesion on Rough Surfaces Using Atomic Force Microscopy With a Liquid Probe

Beilstein Journal of Nanotechnology
Electronic EngineeringMaterials ScienceNanoscienceElectricalNanotechnologyAstronomyPhysics
2017English

Simulation of Multi-Layer Rough Surfaces Media in the Passive Millimeter-Wave Imaging

Progress In Electromagnetics Research M
OpticalElectronicCondensed Matter PhysicsMagnetic Materials
2016English

Monte Carlo Simulation of Electromagnetic Scattering From Two-Dimensional Random Rough Surfaces

IEEE Transactions on Antennas and Propagation
Electronic EngineeringElectricalCondensed Matter Physics
1997English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy