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Introduction to Sophisticated Instrumentation in Education Through the Use of a Scanning Electron Microscope Simulator

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927602104405
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Abstract

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Categories
Instrumentation
Date

August 1, 2002

Authors
G. CasuccioH. LentzS. KennedyC. StaunJ. LangS. ChumbleyC. HargraveT. Nolan
Publisher

Cambridge University Press (CUP)


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