Experimental Extraction of Effective Refractive Index and Thermo-Optic Coefficients of Silicon-On-Insulator Waveguides Using Interferometers
Journal of Lightwave Technology - United States
doi 10.1109/jlt.2015.2476603
Full Text
Open PDFAbstract
Available in full text
Date
November 1, 2015
Authors
Publisher
Institute of Electrical and Electronics Engineers (IEEE)