Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction"

doi 10.7287/peerj.preprints.1260v2
Full Text
Abstract

Available in full text

Date
Authors
Publisher

PeerJ

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy