Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927614008083
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Effects of Fast Secondary Electrons to Low-Voltage Electron Beam Lithography

Journal of Micro/ Nanolithography, MEMS, and MOEMS
Electronic EngineeringCondensed Matter PhysicsMechanical EngineeringElectronicMolecular Physics,NanoscienceOpticalElectricalAtomicMagnetic MaterialsNanotechnologyOptics
2007English

Tensile Properties of Optical Fiber Irradiated by Low Voltage Electron Beam Homogeneously

Materials Transactions
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2012English

Low Voltage Electron Holography - High Voltage Electron Holography

Microscopy and Microanalysis
Instrumentation
2002English

Fabrication of W-Nanodendrite Structures Using Electron-Beam-Induced Deposition and Effect of Accelerating Voltage

Materia Japan
2005English

Electron-Beam Instability in Left-Handed Media

Physical Review Letters
AstronomyPhysics
2008English

Experimental Investigation of Megavoltage Electron Beam Scattering

English

Electrical Characterization of Defects Induced by Electron Beam Exposure in Low Doped N -GaAs

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
High Energy PhysicsInstrumentationNuclear
2017English

Physics of Low Voltage Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2002English

Focused Electron-Beam Induced Deposition, in Situ TEM and Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures

Microscopy and Microanalysis
Instrumentation
2019English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy