Amanote Research
Register
Sign In
Ionizing Doses and Displacement Damage Testing of COTS CMOS Imagers
doi 10.1117/12.2308285
Full Text
Open PDF
Abstract
Available in
full text
Date
November 21, 2017
Authors
Sophie Petit
Sophie Courtade
Frédéric Bernard
Publisher
SPIE
Related search
An Optical Source for Characterizing CMOS Imagers
Development of a Low Cost High Speed Stereo Vision System for Embeded Use Using CMOS Imagers and DSP
TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C
Ectoine Protects DNA From Damage by Ionizing Radiation
Scientific Reports
Multidisciplinary
Semiautomatic LVDT Displacement Transducer Testing System
Effect of Graded Doses of Ionizing Radiation on the Human Testis. [X Rays]
Displacement Damage in Bipolar Linear Integrated Circuits
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
The Genetical Effect of Chronical Ionizing Irradiation in Low Doses on Mice Reproductive Function
Biopolymers and Cell
Biochemistry
Genetics
Molecular Biology
Logic Testing of Bridging Faults in CMOS Integrated Circuits
IEEE Transactions on Computers
Hardware
Architecture
Mathematics
Computational Theory
Theoretical Computer Science
Software
Response of a 0.25 Μm Thin-Film Silicon-On-Sapphire CMOS Technology to Total Ionizing Dose
Journal of Instrumentation
Instrumentation
Mathematical Physics
