Bending Beam Measurement of Moisture Diffusion in Polyimide Films on Silicon Substrate

Polymer Journal - United Kingdom
doi 10.1295/polymj.23.1123
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Springer Science and Business Media LLC

Related search

Microwave Sintering of Ag-Nanoparticle Thin Films on a Polyimide Substrate

AIP Advances
NanotechnologyAstronomyPhysicsNanoscience
2015English

Sintering and Consolidation of Silver Nanoparticles Printed on Polyimide Substrate Films

Macromolecular Research
Organic ChemistryPolymersMaterials ChemistryChemical EngineeringPlastics
2009English

Influence of Atmosphere on Electrical Conduction in Polyimide Films

IEEJ Transactions on Fundamentals and Materials
Electronic EngineeringElectrical
1990English

Electron Beam Effects on Silicon Oxide Films – Structure and Electrical Properties

Microscopy and Microanalysis
Instrumentation
2018English

Inorganic Islands on a Highly Stretchable Polyimide Substrate

Journal of Materials Research
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2009English

Formation of Aluminum Films on Silicon by Ion Beam Deposition: A Comparison With Ionized Cluster Beam Deposition

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
High Energy PhysicsInstrumentationNuclear
1991English

Measurement of the Bending Strength of Vapor-Liquid-Solid Grown Silicon Nanowires

English

Effect of Annealing Temperature on Optical and Electrical Properties of Metallophthalocyanine Thin Films Deposited on Silicon Substrate

Materials Science-Poland
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2016English

Nanostructural Characterization of CrN and CO Thin Films on Silicon Substrate, Modified by Ion Bombardment

English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy