Cover Feature: Investigation of Surface Sulfurization in CuIn1−x Ga X S2−y Se Y Thin Films by Using Kelvin Probe Force Microscopy (ChemPhysChem 3/2018)

ChemPhysChem - Germany
doi 10.1002/cphc.201800091
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Wiley

Related search

Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

English

CuxSnSx+1(x = 2, 3) Thin Films Grown by Sulfurization of Metallic Precursors Deposited by Dc Magnetron Sputtering

Physica Status Solidi (C) Current Topics in Solid State Physics
Condensed Matter Physics
2010English

Mass Spectrometric Investigation of Amorphous Ga-Sb-Se Thin Films

Scientific Reports
Multidisciplinary
2019English

Dynamically Visualizing Battery Reactions by Operando Kelvin Probe Force Microscopy

Communications Chemistry
BiochemistryEnvironmental ChemistryMaterials ChemistryChemistry
2019English

Changes in Plasma Membrane Surface Potential of PC12 Cells as Measured by Kelvin Probe Force Microscopy

PLoS ONE
Multidisciplinary
2012English

Investigation of the Cleaved Surface of a P–i–n Laser Using Kelvin Probe Force Microscopy and Two-Dimensional Physical Simulations

Applied Physics Letters
AstronomyPhysics
2000English

Nanostructure of Thin Gold Films Investigated by Means of Atomic Force Microscopy and X-Ray Reflectometry Methods

Acta Physica Polonica A
AstronomyPhysics
2002English

Direct Measurement of Minority Carriers Diffusion Length Using Kelvin Probe Force Microscopy

Applied Physics Letters
AstronomyPhysics
1999English

Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy

2011English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy