Method for Measuring Deuterium in Erbium Deuteride Films

doi 10.2172/562572
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Office of Scientific and Technical Information (OSTI)

Related search

Deuterium Retention in Tungsten-Doped Carbon Films

Physica Scripta
Condensed Matter PhysicsOpticsMolecular Physics,Mathematical PhysicsAtomicAstronomyPhysics
2009English

Method and Apparatus for the Rapid Conversion of Deuterium Oxide Into Deuterium

Journal of Research of the National Bureau of Standards
1937English

Deuterium Retention in Tungsten Films Deposited by Magnetron Sputtering

Physica Scripta
Condensed Matter PhysicsOpticsMolecular Physics,Mathematical PhysicsAtomicAstronomyPhysics
2014English

Measuring Thin Transparent Films Precisely

Optik & Photonik
2018English

A Method for Service Reusability Measuring

Journal of Computer Science and Cybernetics
2012English

Simple Method for Measuring Small Retardance

Themes in Applied Sciences Research
2018English

Structural and Photoluminescence Studies of Erbium-Implanted Nanocrystalline Silicon Thin Films

Physica Status Solidi (A) Applications and Materials Science
SurfacesElectronic EngineeringCondensed Matter PhysicsMaterials ChemistryOpticalElectricalMagnetic MaterialsFilmsCoatingsElectronicInterfaces
2009English

Method for Measuring Postantifungal Effect in Aspergillus Species

Antimicrobial Agents and Chemotherapy
Infectious DiseasesPharmacology
2002English

Objective Method for Measuring Ham Conformation

Annales de Zootechnie
1980English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy