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OBIC Analysis of Stressed, Thermally-Isolated Polysilicon Resistors
doi 10.1109/relphy.1995.513685
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Date
January 1, 1995
Authors
E.I. Cole
J.S. Suehle
K.A. Peterson
P. Chaparala
A.N. Campbell
E.S. Snyder
D.G. Pierce
Publisher
IEEE
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