Three-Dimensional Microstructural Visualization of Mitosis Using Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) and 3Mv Ultra-High Voltage Electron Microscope (UHVEM) Tomography With Nanoscale Resolution at Whole Cell Level
Biophysical Journal - United States
doi 10.1016/j.bpj.2014.11.3363
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January 1, 2015
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Elsevier BV