THICKNESS DETERMINATION OF Al FILMS ON Si BY a MONTE CARLO CODE INCLUDING a SECONDARY FLUORESCENCE CORRECTION

Le Journal de Physique Colloques
doi 10.1051/jphyscol:1984207
Full Text
Abstract

Available in full text

Date
Authors
Publisher

EDP Sciences

Related search

A Monte Carlo Code for Deep Penetrations of Gamma Rays

1958English

Erratum to : Thickness Measuerments of Al Films With X-Ray Fluorescence

Shinku
1991English

Prediction of Protein Secondary-Structure by Monte Carlo Simulation

Revista de Chimie
SurfacesMaterials ScienceEngineeringMaterials ChemistryFilmsCoatingsChemistry
2008English

The OpenMC Monte Carlo Particle Transport Code

Annals of Nuclear Energy
EngineeringNuclear Energy
2013English

Electron Monte Carlo Simulations of Nanoporous Si Thin Films—The Influence of Pore-Edge Charges

Journal of Applied Physics
AstronomyPhysics
2019English

Radiographic Capabilities of the MERCURY Monte Carlo Code

Nuclear Technology
High Energy PhysicsNuclearEngineeringNuclear EnergyCondensed Matter Physics
2009English

Integration of Kinetic Ions in a Three-Dimensional Monte-Carlo Neutral Transport Code

Contributions to Plasma Physics
Condensed Matter Physics
2020English

Monte Carlo Simulation by Code of McNp and Experimental Check for Measuring Thickness of Materials for the Specializing System of Myo-101

Science and Technology Development Journal
2010English

Light Scattering in Thin Turbid Tissue Including Macroscopic Porosities: A Study Based on a Monte Carlo Model

Optics Communications
Electronic EngineeringElectronicMolecular Physics,Theoretical ChemistryOpticalElectricalAtomicMagnetic MaterialsOpticsPhysical
2018English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy