Radiation Hardness Evaluations of 65 Nm Fully Depleted Silicon on Insulator and Bulk Processes by Measuring Single Event Transient Pulse Widths and Single Event Upset Rates
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes - Japan
doi 10.7567/jjap.54.04dc15
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Date
March 19, 2015
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Japan Society of Applied Physics