A Technique for Measurement of Insulating Powder Specimens by Secondary Ion Mass Spectrometry.

Analytical Sciences - Japan
doi 10.2116/analsci.7.779
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Japan Society for Analytical Chemistry

Related search

Secondary Ion Mass Spectrometry (SIMS)

Zairyo to Kankyo/ Corrosion Engineering
SurfacesAlloysMetalsMaterials ChemistryElectrochemistryFilmsCoatings
1993English

Secondary Ion Mass Spectrometry (SIMS)

English

Characterization of Electrodeposited Metal Coatings by Secondary Ion Mass Spectrometry

Surface and Coatings Technology
SurfacesCondensed Matter PhysicsInterfacesMaterials ChemistryFilmsCoatingsChemistry
2006English

Ultra Shallow Depth Profiling by Secondary Ion Mass Spectrometry Techniques

AIP Conference Proceedings
AstronomyPhysics
2003English

Secondary Ion Mass Spectrometry: A Tool for Identification of Matrix-Isolated Species

Journal of the Chemical Society, Chemical Communications
1978English

Colocalization of the Ganglioside GM1and Cholesterol Detected by Secondary Ion Mass Spectrometry

Journal of the American Chemical Society
BiochemistryColloidCatalysisChemistrySurface Chemistry
2013English

Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging

Microscopy and Microanalysis
Instrumentation
2016English

New Approach for Improvement of Secondary Ion Mass Spectrometry Profile Analysis

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
EngineeringAstronomyPhysics
2007English

Quantitative Analysis of Zn-Fe Alloy Galvanized Layer by Secondary Ion Mass Spectrometry

Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
AlloysCondensed Matter PhysicsMetalsTheoretical ChemistryMaterials ChemistryPhysical
1986English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy