Damage Characterization of Semiconductor Devices for the AN/TRC-145 EMP Study

doi 10.21236/ada095021
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Defense Technical Information Center

Related search

Characterization of Enhanced Conductivity Dielectrics for Use in Semiconductor Devices.

English

The Quantum Hydrodynamic Model for Semiconductor Devices

SIAM Journal on Applied Mathematics
Applied Mathematics
1994English

Semiconductor Physics and Semiconductor Devices

The Journal of the Institute of Television Engineers of Japan
1974English

Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices

Microscopy and Microanalysis
Instrumentation
2018English

Study of Interface Charge Densities for ZrO2and HfO2Based Metal-Oxide-Semiconductor Devices

Advances in Materials Science and Engineering
Materials ScienceEngineering
2014English

Basics of Semiconductor Devices

2016English

Passivation of Semiconductor Devices.

HYBRIDS
1986English

Physics of Semiconductor Devices

2002English

Infrared Semiconductor Devices

The Review of Laser Engineering
1985English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy