High-Resolution Measurements of Scattering in Wheat Canopies-Implications for Crop Parameter Retrieval
IEEE Transactions on Geoscience and Remote Sensing - United States
doi 10.1109/tgrs.2003.814132
Full Text
Open PDFAbstract
Available in full text
Date
July 1, 2003
Authors
Publisher
Institute of Electrical and Electronics Engineers (IEEE)