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Advanced Physical Modeling of SiOx Resistive Random Access Memories
doi 10.1109/sispad.2016.7605169
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Date
September 1, 2016
Authors
Toufik Sadi
Liping Wang
David Gao
Adnan Mehonic
Luca Montesi
Mark Buckwell
Anthony Kenyon
Alexander Shluger
Asen Asenov
Publisher
IEEE