Applications of Focused Ion Beam Using FEI DualBeam DB235: How Deep Is How Small a Hole? & How to Drill It Deeper & Smaller?
Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927603444437
Full Text
Open PDFAbstract
Available in full text
Categories
Date
July 24, 2003
Authors
Publisher
Cambridge University Press (CUP)