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NDE of Microstructured Materials by X-Ray Diffraction and Refraction Topography
doi 10.1117/12.541532
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Date
July 21, 2004
Authors
Manfred P. Hentschel
Axel Lange
K.-Wolfram Harbich
Joerg Schors
Oliver Wald
Bernd R. Mueller
Publisher
SPIE