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X-Ray CTR Scattering Measurements Using Conventional X-Ray Source to Study Semiconductor Hetero-Interfaces
Transactions of the Materials Research Society of Japan
doi 10.14723/tmrsj.33.591
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Date
January 1, 2008
Authors
Y. Maeda
T. Mizuno
A. Mori
M. Tabuchi
Y. Takeda
Publisher
The Materials Research Society of Japan
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