Amanote Research
Register
Sign In
X-Ray CTR Scattering Measurements Using Conventional X-Ray Source to Study Semiconductor Hetero-Interfaces
Transactions of the Materials Research Society of Japan
doi 10.14723/tmrsj.33.591
Full Text
Open PDF
Abstract
Available in
full text
Date
January 1, 2008
Authors
Y. Maeda
T. Mizuno
A. Mori
M. Tabuchi
Y. Takeda
Publisher
The Materials Research Society of Japan
