Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s143192761005484x
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials

Microscopy Today
2017English

Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2009English

Imaging of Built-In Electric Field at a P-N Junction by Scanning Transmission Electron Microscopy

Scientific Reports
Multidisciplinary
2015English

Defect Characterization Using Transmission Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2018English

Scanning Transmission Ion Microscopy and Diffraction Imaging

Microscopy and Microanalysis
Instrumentation
2010English

Efficient Elastic Imaging of Single Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2011English

Imaging Local Polarization and Domain Boundaries With Picometer-Precision Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2016English

Crystal Structure Analysis Using Scanning Transmission Electron Microscopy

Nihon Kessho Gakkaishi
2019English

Analysis of Nanostructures With Scanning Transmission Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2003English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy