A New Run-To-Run Approach for Reducing Contact Bounce in Electromagnetic Switches

IEEE Transactions on Industrial Electronics - United States
doi 10.1109/tie.2016.2605622
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Related search

Is It Possible to Run a Self‐supporting Scleral Contact Lenses Practise?

Acta Ophthalmologica
MedicineOphthalmology
2018English

Convergence Analysis of Run-To-Run Control for a Class of Nonlinear Systems

English

Run-To-Run Control of DC-sputtering Processes

2001English

Gaussian Process Regression for Virtual Metrology-Enabled Run-To-Run Control in Semiconductor Manufacturing

IEEE Transactions on Semiconductor Manufacturing
Electronic EngineeringIndustrialCondensed Matter PhysicsManufacturing EngineeringOpticalElectricalMagnetic MaterialsElectronic
2018English

Long-Run Expectations in a Learning-To-Forecast Experiment: A Simulation Approach

Journal of Evolutionary Economics
AccountingManagementEconomicsEconometricsBusiness
2018English

Performance Evaluation of Run-To-Run Control Methods in Semiconductor Processes

English

‘Made to Run’

Marketing Theory
Marketing
2018English

Short Run and Long Run

1994English

How to Run Elections

Nature
Multidisciplinary
1983English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy