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Computer-Aided Design for Integrated Circuits

Microelectronics Reliability- United Kingdom

doi 10.1016/0026-2714(68)90299-0

Full Text

Abstract

Available in

Categories

SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk

Date

May 1, 1968

Authors

Unknown

Publisher

Elsevier BV


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