Amanote Research
Register
Sign In
On the Adoption of MC/DC and Control-Flow Adequacy for a Tight Integration of Program Testing and Statistical Fault Localization
Information and Software Technology
- Netherlands
doi 10.1016/j.infsof.2012.10.001
Full Text
Open PDF
Abstract
Available in
full text
Categories
Computer Science Applications
Information Systems
Software
Date
May 1, 2013
Authors
Bo Jiang
Ke Zhai
W.K. Chan
T.H. Tse
Zhenyu Zhang
Publisher
Elsevier BV
Related search
Spectrum-Based and Program Slicing Statistical Fault Localization
DEStech Transactions on Computer Science and Engineering
Inter-Context Control-Flow and Data-Flow Test Adequacy Criteria for nesC Applications
Research of Multiple Fault Localization Based on Cluster Analysis of Program Failures
International Journal of Signal Processing, Image Processing and Pattern Recognition
Signal Processing
Statistical Distances and the Construction of Evidence Functions for Model Adequacy
Frontiers in Ecology and Evolution
Evolution
Ecology
Systematics
Behavior
Microfluidic Very Large-Scale Integration for Biochips: Technology, Testing and Fault-Tolerant Design
Hardware Based Testing of Communication Based Control for DC Microgrid
On the Empirical Evaluation of Fault Localization Techniques for Spreadsheets
Lecture Notes in Computer Science
Computer Science
Theoretical Computer Science
A Statistical Indoor Localization Method for Supporting Location-Based Access Control
Mobile Networks and Applications
Information Systems
Computer Networks
Hardware
Communications
Architecture
Software
Modified Fermi Control Rod Latch for the Fftf: Report on the Development and Testing Program.
